General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
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GB 15651.4-2017
GB 15651.4-2017 Referenced Document
IEC 60747-1 Semiconductor devices – Part 1: General (Edition 2.1 Consolidated Reprint)
IEC 62007-1 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics*, 2022-09-22 Update
IEC 62007-2 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
ISO 1 Geometrical product specifications (GPS) — Standard reference temperature for the specification of geometrical and dimensional properties*, 2022-06-14 Update
ISO 11146-1 Lasers and laser-related equipment - Test methods for laser beam widths, divergence angles and beam propagation ratios - Part 1: Stigmatic and simple astigmatic beams*, 2021-06-30 Update
ISO 11146-2 Lasers and laser-related equipment — Test methods for laser beam widths, divergence angles and beam propagation ratios — Part 2: General astigmatic beams*, 2021-07-02 Update
ISO 11554 Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power, energy and temporal characteristics*, 2017-08-07 Update
ISO 11670 Lasers and laser-related equipment - Test methods for laser beam parameters - Beam positional stability; Technical Corrigendum 1
ISO 12005 Lasers and laser-related equipment — Test methods for laser beam parameters — Polarization*, 2022-05-31 Update
ISO 13694 Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power (energy) density distribution*, 2018-11-02 Update
ISO 13695 Optics and photonics - Lasers and laser-related equipment - Test methods for the spectral characteristics of lasers
ISO 17526 Optics and optical instruments - Lasers and laser-related equipment - Lifetime of lasers