The ultra-fast thermal shock testing machine is a special equipment for performance testing and inspection of crystal components, semiconductors, chips and other components. With the increasing demand for this product due to the development of the domestic semiconductor and chip market, it originally relied mainly on imports. After domestic research and development, it has met the requirements for use, replaced imports, saved costs, met the needs of domestic users, and exported some of them, reaching the international level of similar technology.
T/JAR 008/1-2023 history
2023T/JAR 008/1-2023 Specification for ultra-rapid thermal shock testing machine