NF C96-022-30/A1*NF EN 60749-30/A1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
2011NF C96-022-30/A1*NF EN 60749-30/A1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing