GB/T 42902-2023
Laser Scattering Method for Testing Surface Defects of Silicon Carbide Epitaxial Wafers (English Version)

Standard No.

GB/T 42902-2023

Language

Chinese, Available in English version

Release Date

2023

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 42902-2023

GB/T 42902-2023 history

• 2023 GB/T 42902-2023 Laser Scattering Method for Testing Surface Defects of Silicon Carbide Epitaxial Wafers