DIN EN 60749-29:2012-01
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011 / Note: DIN EN 60749-29 (2004-07) remains valid alongside this standard until 2014-05-12.
- Standard No.
- DIN EN 60749-29:2012-01
- Release Date
- 2012
- Published By
- German Institute for Standardization
- Latest
- DIN EN 60749-29:2012-01
DIN EN 60749-29:2012-01 history
- 2012 DIN EN 60749-29:2012-01 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011 / Note: DIN EN 60749-29 (2004-07) remains valid alongside this standard until 2014-05-12.
