YD/T 3037.1.1-2016
Test method for USB interface characteristics between Universal Integrated Circuit Card (UICC) and terminal Part 1: Terminal (English Version)

Standard No.

YD/T 3037.1.1-2016

Language

Chinese, Available in English version

Release Date

2016

Published By

工业和信息化部

Latest

YD/T 3037.1.1-2016

YD/T 3037.1.1-2016 history

• 2016 YD/T 3037.1.1-2016 Test method for USB interface characteristics between Universal Integrated Circuit Card (UICC) and terminal Part 1: Terminal