T/CESA 1120-2020
AI chips-Test metrics and test method of deep learning chips for edge side (English Version)
- Standard No.
- T/CESA 1120-2020
- Language
- Chinese, Available in English version
- Release Date
- 2020
- Published By
- Group Standards of the People's Republic of China
- Latest
- T/CESA 1120-2020
- Scope
- This document specifies the test indicators, test methods and requirements for functional and performance testing of edge-side deep learning chips, and is applicable to edge-side deep learning chips. This document only specifies the general principles for edge-side deep learning chip benchmarking. This document is suitable for third-party institutions to conduct performance testing and evaluation of edge-side deep learning chips, and is also applicable to the procurement and design of edge-side deep learning chip products. Edge-side chips do not necessarily have training capabilities.
T/CESA 1120-2020 history
- 2020 T/CESA 1120-2020 AI chips-Test metrics and test method of deep learning chips for edge side
