GB/T 43313-2023
Testing of surface quality and microtube density of silicon carbide polished wafers using confocal differential interference method (English Version)

Standard No.

GB/T 43313-2023

Language

Chinese, Available in English version

Release Date

2023

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 43313-2023

GB/T 43313-2023 history

• 2023 GB/T 43313-2023 Testing of surface quality and microtube density of silicon carbide polished wafers using confocal differential interference method