KS C IEC 60747-4-1-2020
Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification

Standard No.

KS C IEC 60747-4-1-2020

Release Date

2020

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS C IEC 60747-4-1-2020

KS C IEC 60747-4-1-2020 history

• 2020 KS C IEC 60747-4-1-2020 Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification
• 0000 KS C IEC 60747-4-1-2002(2017)
• 2002 KS C IEC 60747-4-1:2002 Semiconductor devices－Discrete devices－Part 4－1：Microwave diodes and transistors－Microwave field effect transistors－Blank detail specification