IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
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IEEE C37.26-2014
Scope
This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and lower) test circuits. These methods may be used at any frequency; however@ the values in the tables are specifically for 60-Hz test circuits. These methods are as follows: a) Ratio method b) DC decrement method c) Phase relationship method Table 1 lists the preferred methods to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits@ the methods discussed are also usable at higher voltages. Purpose The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits@ so that the preferred method giving the greatest accuracy is recommended for any particular circuit.
IEEE C37.26-2014 history
2014IEEE C37.26-2014 Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits
2003IEEE C37.26-2003 Guide for Methods of Power Factor Measurement for Low-Voltage Inductive Test Circuits
1970IEEE C37.26-1972 IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
1971IEEE C37.26-1971 Standard Guide for Methods of Power-Factor Measurement for Low- Voltage Inductive Test Circuits