DIN EN 62047-8:2011-12
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011
- Standard No.
- DIN EN 62047-8:2011-12
- Release Date
- 2011
- Published By
- German Institute for Standardization
- Latest
- DIN EN 62047-8:2011-12
DIN EN 62047-8:2011-12 history
- 2011 DIN EN 62047-8:2011-12 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011
- 2011 DIN EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011
- 0000 DIN IEC 62047-8:2008
