SAE J1752-2-1995
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit Radiated Emissions Diagnostic Procedure 1 MHz to 1000 MHz@ Magnetic Field - Loop Probe@ Recommended Practice (March 1995)

Standard No.

SAE J1752-2-1995

Release Date

1995

Published By

SAE - SAE International

Status

Be replaced

Replace By

SAE J1752-2-2003

Latest

SAE J1752-2-2016

SAE J1752-2-1995 history

• 2016 SAE J1752-2-2016 Measurement of Radiated Emissions from Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
• 2011 SAE J1752-2-2011 Measurement of Radiated Emissions from Integrated Circuits Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
• 2003 SAE J1752-2-2003 Measurement of Radiated Emissions from Integrated CircuitsSurface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
• 1995 SAE J1752-2-1995 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit Radiated Emissions Diagnostic Procedure 1 MHz to 1000 MHz@ Magnetic Field - Loop Probe@ Recommended Practice (March 1995)