DIN 50456-2:1995
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test

Standard No.
DIN 50456-2:1995
Release Date
1995
Published By
German Institute for Standardization
Status
Latest
DIN 50456-2:1995

DIN 50456-2:1995 history

  • 1995 DIN 50456-2:1995 Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test



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