NF C96-022-31*NF EN 60749-31:2003 Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)
2003NF C96-022-31*NF EN 60749-31:2003 Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)