DIN 50433-3:1982
Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering

Standard No.

DIN 50433-3:1982

Release Date

1982

Published By

German Institute for Standardization

Status

Withdraw

Latest

DIN 50433-3:1982

Scope

Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scatteringEssais de matériaux pour la technologie semi-conducteurs; détermination de l'orientation de monocristaux par méthode pa

DIN 50433-3:1982 history

• 1982 DIN 50433-3:1982 Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering