DIN EN ISO 8289-1 E:2019-03
Low-voltage testing of enamels and enamels for detection and localization of defects Part 1: Wipe testing of non-contoured surfaces (draft)

Standard No.
DIN EN ISO 8289-1 E:2019-03
Release Date
1970
Published By
/
Status
 2020-06
Replace By
DIN EN ISO 8289-1:2020
Latest
DIN EN ISO 8289-1:2020-06

DIN EN ISO 8289-1 E:2019-03 history

  • 2020 DIN EN ISO 8289-1:2020-06 Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for non-profiled surfaces (ISO 8289-1:2020); German version EN ISO 8289-1:2020
  • 2020 DIN EN ISO 8289-1:2020 Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for non-profiled surfaces (ISO 8289-1:2020)
  • 1970 DIN EN ISO 8289-1 E:2019-03 Low-voltage testing of enamels and enamels for detection and localization of defects Part 1: Wipe testing of non-contoured surfaces (draft)
Low-voltage testing of enamels and enamels for detection and localization of defects Part 1: Wipe testing of non-contoured surfaces (draft)



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