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T/SLEIA 0003-2024
Optocoupler reliability evaluation method (English Version)
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T/SLEIA 0003-2024
Standard No.
T/SLEIA 0003-2024
Language
Chinese,
Available in English version
Release Date
2024
Published By
Group Standards of the People's Republic of China
Latest
T/SLEIA 0003-2024
Scope
This document specifies the low-frequency noise parameters, evaluation methods and method applications used for reliability evaluation of optoelectronic coupling devices (hereinafter referred to as devices).
T/SLEIA 0003-2024 history
2024
T/SLEIA 0003-2024
Optocoupler reliability evaluation method
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EN 60747-5-5:2011 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (Incorporates Amendment A1: 2015
IEC 60747-5-5:2013 Semiconductor devices.Discrete devices.Part 5-5: Optoelectronic devices.Photocouplers
BS EN 60747-5-5:2011 Semiconductor devices. Discrete devices. Optoelectronic devices. Photocouplers
IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
GOST 24613.9-1983 Optoelectronic integrated microcircuits and optocouplers. Method for measuring switching times
GOST 24613.1-1981 Optoelectronic integrated microcircuits and optocouplers. Method for measuring of input-to-output capacitance
GOST 24613.2-1981 Optoelectronic integrated microcircuits and opto-couples. Method for measuring leatage current
GOST 24613.3-1981 Optoelectronic integrated microcircuits and opto-couples. Method for measuring input voltage
GOST 24613.6-1981 Optoelectronic integrated microcircuits and optocouplers. Method for measuring of isolation voltage
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