GSO IEC 62373:2014
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Standard No.

GSO IEC 62373:2014

Release Date

2014

Published By

GSO

Latest

GSO IEC 62373:2014

Scope

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

GSO IEC 62373:2014 history

• 2014 GSO IEC 62373:2014 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)