IEEE Std 1687-2014
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

Standard No.

IEEE Std 1687-2014

Release Date

2014

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE Std 1687-2014

Scope

A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware descripti...

IEEE Std 1687-2014 history

• 2014 IEEE Std 1687-2014 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device