DB13/T 5696-2023
Rapid defect screening method for GaN HEMT RF power devices based on high temperature reverse bias test (English Version)
- Standard No.
- DB13/T 5696-2023
- Language
- Chinese, Available in English version
- Release Date
- 2023
- Published By
- Hebei Provincial Standard of the People's Republic of China
- Latest
- DB13/T 5696-2023
DB13/T 5696-2023 history
- 2023 DB13/T 5696-2023 Rapid defect screening method for GaN HEMT RF power devices based on high temperature reverse bias test
