T/ZZB Q041-2022
Mixed signal semiconductor device test equipment (English Version)

Standard No.

T/ZZB Q041-2022

Language

Chinese, Available in English version

Release Date

2022

Published By

Group Standards of the People's Republic of China

Latest

T/ZZB Q041-2022

Scope

This document specifies the terms and definitions, basic parameters, technical requirements, test methods, inspection rules, identification, packaging, transportation and storage of mixed-signal semiconductor device test equipment (hereinafter referred to as test equipment). This document applies to digital chips, analog chips, digital-analog hybrid chips and other semiconductor device function and performance testing equipment.

T/ZZB Q041-2022 history

• 2022 T/ZZB Q041-2022 Mixed signal semiconductor device test equipment