GSO IEC 63284:2024
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors

Standard No.

GSO IEC 63284:2024

Release Date

2024

Published By

GSO

Latest

GSO IEC 63284:2024

Scope

IEC 63284:2022 covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress

GSO IEC 63284:2024 history

• 2024 GSO IEC 63284:2024 Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors