KS C IEC 60749-16-2021
Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)

Standard No.

KS C IEC 60749-16-2021

Release Date

2021

Published By

Korean Agency for Technology and Standards (KATS)

Latest

KS C IEC 60749-16-2021

KS C IEC 60749-16-2021 history

• 2021 KS C IEC 60749-16-2021 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)
• 0000 KS C IEC 60749-16-2006(2016)
• 2006 KS C IEC 60749-16:2006 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)