SJ/T 11702-2018
Semiconductor integrated circuit serial peripheral interface test method (English Version)
- Standard No.
- SJ/T 11702-2018
- Language
- Chinese, Available in English version
- Release Date
- 2018
- Published By
- 工业和信息化部
- Latest
- SJ/T 11702-2018
SJ/T 11702-2018 history
- 2018 SJ/T 11702-2018 Semiconductor integrated circuit serial peripheral interface test method
