NF C96-022-40*NF EN 60749-40:2012
Semiconductor devices - Mechanical and climatic test methods - Part 40 : board level drop test method using a strain gauge

Standard No.

NF C96-022-40*NF EN 60749-40:2012

Release Date

2012

Published By

Association Francaise de Normalisation

Latest

NF C96-022-40*NF EN 60749-40:2012

NF C96-022-40*NF EN 60749-40:2012 history

• 2012 NF C96-022-40*NF EN 60749-40:2012 Semiconductor devices - Mechanical and climatic test methods - Part 40 : board level drop test method using a strain gauge