BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices - Test methods for MEMS piezoresistive pressure-sensitive device on wafer
- Standard No.
- BS IEC 62047-34:2019
- Release Date
- 2019
- Published By
- British Standards Institution (BSI)
- Latest
- BS IEC 62047-34:2019
- Scope
- What is BS IEC 62047-34- MEMS piezoresistive pressure-sensitive devices about? BS IEC 62047-34 is the thirty-fourth part of the Semiconductor devices and microelectromechanical devices that specifies the test methods and test procedures for MEMS piezoresistive pressure-sensitive devices on wafers. By using BS IEC 62047-34 you can manufacture good quality microelectromechanical devices. BS IEC 62047-34 describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. BS IEC 62047-34 applies to both open and closed loop piezoresistive MEMS pressure devices on the wafer. Who is BS IEC 62047-34- MEMS piezoresistive pressure-sensitive devices for? BS IEC 62047-34 Semiconductor devices are beneficial for:
BS IEC 62047-34:2019 history
- 2019 BS IEC 62047-34:2019 Semiconductor devices. Micro-electromechanical devices - Test methods for MEMS piezoresistive pressure-sensitive device on wafer
