NF C96-022-3*NF EN 60749-3:2017
Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination

Standard No.

NF C96-022-3*NF EN 60749-3:2017

Release Date

2017

Published By

Association Francaise de Normalisation

Latest

NF C96-022-3*NF EN 60749-3:2017

NF C96-022-3*NF EN 60749-3:2017 history

• 2017 NF C96-022-3*NF EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination