IEEE Std 300-1988
IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Standard No.

IEEE Std 300-1988

Release Date

1988

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Status

Be replaced

Replace By

IEEE Std 300-1988(R2006)

Latest

IEEE Std 300-1988(R2006)

Scope

This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. Th...

IEEE Std 300-1988 history

• 0000 IEEE Std 300-1988(R2006)
• 1988 IEEE Std 300-1988 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
• 1982 IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
• 1970 IEEE 300-1969 USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)