This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. In general, this mechanical shock test is in conformity with IEC 60068-2-27 but, due to specific requirements of semiconductors, the clauses of this standard apply.
GSO IEC 60749-10:2014 history
2014GSO IEC 60749-10:2014 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock