EN 60749-29:2003
Semiconductor devices Mechanical and climatic test methods Part 29: Latch-up test

Standard No.

EN 60749-29:2003

Release Date

2003

Published By

CENELEC - European Committee for Electrotechnical Standardization

Status

Be replaced

Replace By

EN 60749-29:2011

Latest

EN 60749-29:2011

EN 60749-29:2003 history

• 2011 EN 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
• 2003 EN 60749-29:2003 Semiconductor devices Mechanical and climatic test methods Part 29: Latch-up test