UNE-EN 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)

Standard No.
UNE-EN 60749-40:2011
Release Date
2011
Published By
ES-UNE
Latest
UNE-EN 60749-40:2011

UNE-EN 60749-40:2011 history

  • 2011 UNE-EN 60749-40:2011 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)



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