DIN EN 60749-40:2012-02
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011); German version EN 60749-40:2011

Standard No.

DIN EN 60749-40:2012-02

Release Date

2012

Published By

German Institute for Standardization

Latest

DIN EN 60749-40:2012-02

DIN EN 60749-40:2012-02 history

• 2012 DIN EN 60749-40:2012-02 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011); German version EN 60749-40:2011
• 2012 DIN EN 60749-40:2012 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (IEC 60749-40:2011); German version EN 60749-40:2011
• 0000 DIN IEC 60749-40:2009