IEEE 1181-1991
Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization

Standard No.

IEEE 1181-1991

Release Date

1991

Published By

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

Latest

IEEE 1181-1991

IEEE 1181-1991 history

• 1991 IEEE 1181-1991 Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization