SPC GB/T 26068-2018
Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)

Standard No.

SPC GB/T 26068-2018

Release Date

2019

Published By

SCC

Latest

SPC GB/T 26068-2018

SPC GB/T 26068-2018 history

• 2019 SPC GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)