SJ/T 10805-2018
Semiconductor integrated circuit voltage comparator test method (English Version)

Standard No.

SJ/T 10805-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

工业和信息化部

Latest

SJ/T 10805-2018

Replace

SJ/T 10805-2000

SJ/T 10805-2018 history

• 2018 SJ/T 10805-2018 Semiconductor integrated circuit voltage comparator test method
• 2000 SJ/T 10805-2000 Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
• 1970 SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators