ASTM F744M-97(2003)
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

Standard No.

ASTM F744M-97(2003)

Release Date

1997

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM F744M-10

Latest

ASTM F744M-16

ASTM F744M-97(2003) history

• 2016 ASTM F744M-16 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
• 2010 ASTM F744M-10 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
• 1997 ASTM F744M-97(2003) Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
• 1997 ASTM F744M-97 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits