"FOREWORD Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The advent of semiconductor detectors has stimulated development of electronic instruments with characteristics that permit exploitation of their capabilities. This has made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users. This Test Procedure is not intended to imply that all tests described herein are mandatory@ but only that such tests as are carried out should be performed in accordance with the procedures herein. A companion document is ""Test Procedure for Semiconductor Radiation Detectors@"" IEEE Standards Publication No. 300. The Institute wishes to acknowledge its indebtedness to those who have so freely given of their time and knowledge@ and have conducted experimental work on which many of the IEEE publications are based. This publication was prepared by the Radiation Detectors Committee of the IEEE Nuclear Science Group. The membership of the Committee was:"
IEEE 301-1969 history
1988IEEE 301-1988 Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation
1976IEEE 301-1976 STANDARD TEST PROCEDURES FOR AMPLIFIERS AND PREAMPLIFIERS FOR SEMICONDUCTOR RADIATION DETECTORS FOR IONIZING RADIATION (R 1982)
1969IEEE 301-1969 Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)