ASTM E3220-20
Standard Guide for Characterization of Graphene Flakes

Standard No.
ASTM E3220-20
Release Date
2020
Published By
American Society for Testing and Materials (ASTM)
Latest
ASTM E3220-20
Scope
1.1 This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement. 1.2 This guide is intended to serve as an example for manufacturers, producers, analysts, and others with an interest in graphene and related products such as graphene oxide and reduced graphene oxide. This Standard Guide is not intended to be a comprehensive overview of all possible characterization methods. 1.3 This guide does not include all sample preparation procedures for all possible materials and applications. The user must validate the appropriateness for their particular application. 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ASTM E3220-20 Referenced Document

  • ASTM E2530 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps *2024-04-21 Update

ASTM E3220-20 history

  • 2020 ASTM E3220-20 Standard Guide for Characterization of Graphene Flakes
Standard Guide for Characterization of Graphene Flakes



Copyright ©2024 All Rights Reserved