IEEE 300-1988
Standard Test Procedures for Semiconductor Charged-Particle Detectors

Standard No.

IEEE 300-1988

Release Date

1988

Published By

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

Latest

IEEE 300-1988

IEEE 300-1988 history

• 1988 IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
• 1982 IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
• 1970 IEEE 300-1969 USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)