BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Standard No.

BS IEC 63229:2021

Release Date

2023

Published By

British Standards Institution (BSI)

Latest

BS IEC 63229:2021

BS IEC 63229:2021 history

• 2023 BS IEC 63229:2021 Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate