ISO/DIS 5618-2:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for GaN crystal surface defects — Part 2: Method of determining the etch pit density
International Organization for Standardization (ISO)
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ISO/DIS 5618-2:2023
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2023ISO/DIS 5618-2:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for GaN crystal surface defects — Part 2: Method of determining the etch pit density