GB/T 33657-2017
Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells (English Version)

Standard No.

GB/T 33657-2017

Language

Chinese, Available in English version

Release Date

2017

Published By

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Latest

GB/T 33657-2017

GB/T 33657-2017 history

• 2017 GB/T 33657-2017 Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells