GB/T 35003-2018
Test methods for endurance and data retention of non-volatile memory (English Version)

Standard No.

GB/T 35003-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Latest

GB/T 35003-2018

GB/T 35003-2018 Referenced Document

• GB/T 17574 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits

GB/T 35003-2018 history

• 2018 GB/T 35003-2018 Test methods for endurance and data retention of non-volatile memory