GB/T 42907-2023
Non-contact eddy current induction method for testing non-equilibrium carrier recombination lifetime in silicon ingots, blocks and wafers (English Version)

Standard No.

GB/T 42907-2023

Language

Chinese, Available in English version

Release Date

2023

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 42907-2023

GB/T 42907-2023 history

• 2023 GB/T 42907-2023 Non-contact eddy current induction method for testing non-equilibrium carrier recombination lifetime in silicon ingots, blocks and wafers