IEC 61967-6:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- Standard No.
- IEC 61967-6:2008
- Release Date
- 2008
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 61967-6:2002/AMD1:2008
- Latest
- IEC 61967-6:2002/COR1:2010
IEC 61967-6:2008 history
- 2010 IEC 61967-6:2002/COR1:2010 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- 2008 IEC 61967-6:2002/AMD1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- 2008 IEC 61967-6:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- 2002 IEC 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method
