IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices (Edition 1.0)
- Standard No.
- IEC TR 63133:2017
- Release Date
- 2017
- Published By
- IEC - International Electrotechnical Commission
- Latest
- IEC TR 63133:2017
- Scope
- This Technical Report specifies a design technique of performance estimation storage element@ which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
IEC TR 63133:2017 history
- 2017 IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devices (Edition 1.0)
