ISO 17867:2020
Particle size analysis — Small angle X-ray scattering (SAXS)

Standard No.
ISO 17867:2020
Release Date
2020
Published By
International Organization for Standardization (ISO)
Latest
ISO 17867:2020
Scope
This document specifies a method for the application of small-angle X-ray scattering (SAXS) to the estimation of mean particle sizes in the 1 nm to 100 nm size range. It is applicable in dilute dispersions where the interaction and scattering effects between the particles are negligible. This document describes several data evaluation methods: the Guinier approximation, model-based data fitting, Monte- Carlo–based data fitting, the indirect Fourier transform method and the expectation maximization method. The most appropriate evaluation method is intended to be selected by the analyst and stated clearly in the report. While the Guinier approximation only provides an estimate for the mean particle diameter, the other methods also give insight in the particle size distribution.

ISO 17867:2020 Referenced Document

  • ISO 26824 Particle characterization of particulate systems — Vocabulary*2022-08-08 Update
  • ISO/TS 80004-2 Nanotechnologies - Vocabulary - Part 2: Nano-objects

ISO 17867:2020 history

  • 2020 ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
  • 2015 ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
Particle size analysis — Small angle X-ray scattering (SAXS)



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