Full Description This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
All current amendments available at time of purchase are included with the purchase of this document.
BS PD IEC TS 62607-5-3:2020 history
2020BS PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics-Thin-film organic/nano electronic devices. Measurements of charge carrier concentration