BS IEC 62951-2:2019
Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

Standard No.
BS IEC 62951-2:2019
Release Date
2019
Published By
British Standards Institution (BSI)
Latest
BS IEC 62951-2:2019
Scope
What is BS IEC 62951-2- Flexible thin-film transistor (TFT) about?    BS IEC 62951-2 is the second part of an international standard used for semiconductor devices that specifies the test method and test procedures which helps in manufacturing good quality flexible thin-film transistor (TFT) devices.   BS IEC 62951-2 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin-film transistor (TFT) devices. BS IEC 62951-2 specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.   Who is BS IEC 62951-2- Flexible thin-film transistor (TFT) for?   BS IEC 62951 ‑ 2 Semiconductor devices are beneficial for: BS IEC 62951-2:2019 history
  • 2019 BS IEC 62951-2:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices



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