BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
- Standard No.
- BS ISO 11505:2012
- Release Date
- 2013
- Published By
- British Standards Institution (BSI)
- Status
- 2013-01
- Replace By
- BS ISO 11505:2013
- Latest
- BS ISO 11505:2013
- Scope
- 1 Scope This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined. NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.
BS ISO 11505:2012 history
- 2013 BS ISO 11505:2013 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
- 2013 BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
